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ZYGO ZMI4104 4‑Axis Laser Interferometer Metrology Board
  • Warehouse: Spot
  • Warranty: 365 days
  • Quality: Original module
  • Condition: New
  • Shipping method: Courier delivery

  • Contact person: LI MING
  • Contact number: +86 18059884790
  • WeChat:18059884790
  • E-mail: plc66@qq.com

Product Description

ZYGO ZMI4104 4‑Axis Laser Interferometer Metrology Board (VME64x)

Product Description

The ZMI4104 is a 6U VME64x four‑axis displacement measuring interferometer electronics board manufactured by ZYGO Corporation. It receives heterodyne optical signals from ZMI laser interferometer heads and calculates high‑resolution position and displacement data. It achieves sub‑nanometer measurement resolution down to 0.154 nm, with onboard environmental compensation for air temperature, pressure and humidity errors. The modular VME chassis design allows multi‑board stacking to expand measurement axes up to 64 channels. This board is widely used as a core metrology component for ultra‑precision motion stages in semiconductor lithography and optical manufacturing. The original series has been phased out; available units are mostly surplus or refurbished spare parts for maintenance of legacy precision measurement systems.

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Product Functions

  • Receive and demodulate interferometer optical signals to compute real‑time displacement, position and velocity values for four independent measurement axes
  • Sub‑nanometer high‑precision position output with patented cyclic error correction to suppress non‑linear measurement drift
  • Real‑time environmental refractive‑index compensation to improve long‑term measurement stability on production floors
  • High‑speed position data streaming through VME64x bus for synchronous motion control of precision positioning stages
  • Built‑in hardware self‑diagnosis for optical signal loss, channel failure, bus communication error and overheating status
  • Compatible with ZYGO ZMI laser sources and interferometer optics, supporting long‑range displacement measurement up to 80 meters
  • Provide digital position trigger signals for wafer alignment, laser scanning and automated metrology sequencing

Application Scenarios

  • Semiconductor lithography, wafer inspection and ultra‑precision wafer stage position feedback control
  • MEMS, micro‑optics and diffraction grating manufacturing with nanometer positioning requirements
  • Aerospace precision component testing, optical assembly alignment and laser beam steering systems
  • Hard disk media, magnetic head and high‑end optical component production measurement benches
  • Nanotechnology laboratories, precision coordinate measurement machines and advanced optical research platforms
  • Spare replacement and retrofit of existing ZYGO ZMI series interferometer measurement racks

Common Problems

  • Measurement value drift and poor repeatability:contaminated optical connectors, aging optical receivers or unstable environmental compensation sensors
  • Loss of optical signal and channel timeout:fiber bending damage, dirty fiber end faces, misaligned interferometer or laser source degradation
  • VME bus intermittent data read failure:oxidized backplane connectors, poor chassis contact or VME controller driver incompatibility
  • High noise and jitter on position output:ground loop interference, insufficient shielding or excessive vibration of the measurement rack
  • Over‑temperature warning:dust accumulated on onboard heat sinks, blocked chassis airflow and long‑duration continuous high‑speed sampling
  • Cyclic error correction invalid:incorrect calibration data, corrupted configuration parameters or aging signal processing circuits
  • Maintenance difficulty:original production discontinued, limited replacement chips and no official firmware upgrade service


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