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Contact: POWER DUKE
Phone: +86 18059884790
E-mail: plc66@qq.com
Add: fujian xiamen
- Warehouse: Spot
- Warranty: 365 days
- Quality: Original module
- Condition: New
- Shipping method: Courier delivery
- Contact person: LI MING
- Contact number: +86 18059884790
- WeChat:18059884790
- E-mail: plc66@qq.com
Product Model: LAM 716-443090-002
1. Product Description
716-443090-002 is a specialized precision hardware component exclusively designed for LAM Research semiconductor etching equipment. Manufactured with ultra-clean industrial-grade materials, it features high corrosion resistance, dimensional precision tolerance and vacuum environment adaptability. This component undergoes strict semiconductor factory-level cleaning and surface passivation treatment to avoid particle contamination during wafer processing, fully matching the ultra-high cleanliness requirements of chip manufacturing process chambers.

2. Core Product Functions
- Structural positioning support inside plasma etching reaction chamber
- Isolate and shield plasma chemical corrosion to protect core chamber assemblies
- Stable airflow distribution for process gas circulation on wafer surface
- Maintain consistent thermal conduction balance under high-temperature etching conditions
- Reduce micro-particle generation to guarantee wafer yield rate
Standard modular assembly for quick disassembly and equipment maintenance

3. Application Scenarios
- Semiconductor wafer plasma etching process equipment from LAM Research
- Front-end fabrication chamber of 28nm to 3nm advanced chip production lines
- Logic chip, memory chip and power semiconductor manufacturing workshops
- Ultra-high vacuum cleanroom processing equipment
- RF plasma reaction chamber core internal structural assemblies
Mass production semiconductor fab equipment spare part replacement

4. Common Problems & Troubleshooting
Q1: Excessive particle pollution after component installation
A: Confirm the component is stored in vacuum sealed clean packaging; re-perform ultrasonic ultra-clean washing before installation; check scratch damage on surface coating which causes shedding particles.
Q2: Thermal imbalance leads to wafer etching unevenness
A: Check surface residual etching byproduct deposition; remove accumulated polymer layers via professional chamber cleaning; verify complete contact between component and heating base.
Q3: Corrosion deformation after long-term process operation
A: Replace the component when service life expires; adjust process gas ratio to reduce strong corrosive medium concentration; shorten regular maintenance cycle of chamber internal parts.
Q4: Assembly offset causing chamber air leakage alarm
A: Clean positioning groove foreign contaminants; check component dimensional deformation; reinstall according to official LAM assembly torque specifications.



